Diagnosis and Test

Contact person: Fabio Salice

Test strategies try to detect and diagnose failures in the test process as early as possible, but inevitably some defects are not detected until functional testing is performed. At that point, it is difficult to immediately identify the cause of the misbehavior, and a debug process is necessary.
Diagnosis is today performed by means of (commercial) tools based on approaches that exploit Artificial Intelligence techniques, such as rule-based, model-based and case-based reasoning systems, neural- networks and Bayesian networks.

Work in this area is devoted to investigating new directions for the diagnosis of complex systems, focusing the attention on efficiency and confidence in the results, trying to minimize the amount of effort and tests to identify the candidate fault component(s).

Recent selected publications:

  • L. Amati, C. Bolchini and F. Salice, "Optimal Test Set Selection for Fault Diagnosis Improvement," in Proc. IEEE Intl Symp on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, pp. 93-99, 2011. doi
  • L. Amati, C. Bolchini, F. Salice and F. Franzoso, "Improving Fault Diagnosis Accuracy by Automatic Test Set Modification," in Proc. IEEE Int. Test Conference, 2010. doi
  • L. Amati, C. Bolchini, L. Frigerio, F. Salice, B. Eklow, A. Suvatne, E. Brambilla, F. Franzoso and M. Martin, "An incremental approach to functional diagnosis," in Proc. IEEE Intl Symp on Defect and Fault Tolerance of of VLSI Systems (DFT), pp. 392-400, 2009. bibtex doi
    @inproceedings {DFT2009.ABFSESBFM,
      year = {2009},
      title = {An incremental approach to functional diagnosis},
      pages = {392-400},
      month = {Oct},
      keywords = {Diagnosis},
      doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2009.29},
      booktitle = {Proc. IEEE Intl Symp on Defect and Fault Tolerance of of VLSI Systems (DFT)},
      yy = {2009},
      mm = {10},
      author = {Luca Amati and Cristiana Bolchini and L. Frigerio and Fabio Salice and B. Eklow and A. Suvatne and E. Brambilla and F. Franzoso and M. Martin} }
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